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Exnodes is a semiconductor technology company specializing in advanced defect detection for wafer inspection using its patented Computational Parallel Inspection® (CPI) technology. The company offers…

Exnodes is a semiconductor technology company specializing in advanced defect detection for wafer inspection using its patented Computational Parallel Inspection® (CPI) technology. The company offers…
Core tech: Computational Parallel Inspection (CPI) for visible-light wafer defect detection (~8.9 nm sensitivity)
Founded / HQ: 2014; Fremont, California
Product capability: Detects ~20 nm defects at 120 wafers per hour; real-time feedback suitable for 3 nm node
Business model: Licenses CPI technology to semiconductor companies
Patents: Holds 10 patents
Nanoscale defect detection and wafer inspection for semiconductor manufacturing
2014
DeepTech
Seed round announced Nov 1, 2016; other reported backers include Gordon Eubanks, Joseph Goodman, Nick Conley
“Backed by corporate semiconductor investors (Samsung Ventures, SK Hynix) and angel/backer names”
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